List of subjects - Micro and Nano-Electronics
- Advanced characterisation and test structures for failure analysis in electronic components and materials
- New results in material characterisation and defect analysis;
- Case studies on failure mechanisms and physics of failure;
- Emerging reliability and variability assessment techniques for new materials, process development and novel devices;
- In-situ and in-operando monitoring, non-destructive testing;
- Advanced microscopy, strain measurement, surfaces and interface characterisation applied to semiconductor industry;
- Statistical characterisation and material diagnostics for electronics;
- New characterisation techniques for back-end interconnections, heterogeneous integration, advanced packaging, PCB;
