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09:30
EASY DATA ACQUISITION: High throughput routine characterisation available at the ESRF
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Athanasios PAPAZOUGLOU
(ESRF)
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10:00
Esay data analysis: Advanced Neutron Strain Characterization for Advanced Manufacturing at ILL
-
Sandra Cabeza
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11:00
EASY DATA ANALYSIS - Artificial intelligence supporting data analysis
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Joel EYMERY
(CEA INAC MEM NRS)
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11:25
Introduction to Institut Néel
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Eric MOSSANG
(Institut Néel)
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11:30
EASY EXPLOITATION - Benchmark for development of in-line and at-line metrologies at CEA-LETI
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Guillaume Freychet
(CEA LETI)
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11:55
Introduction to SERMA
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Pascal SALOME