Mar 17 – 22, 2019
Institut Laue Langevin
Europe/Paris timezone

ADD2019 Sponsors


The Institut Laue Langevin is the main host institution for this workshop and an international research centre at the leading edge of neutron science and technology.

The ESRF is the world’s most intense X-ray source, a centre of excellence for fundamental research, also committed to applied and industrial research. Located in Grenoble, France, the ESRF is a model of international cooperation with 21 partner nations, of which 13 are Members and 8 are Scientific Associates.



ISIS is a world-leading centre for research in the physical and life sciences at the Rutherford Appleton Laboratory near Oxford in the United Kingdom. Our suite of neutron and muon instruments allow the properties of materials to be understood at the scale of atoms.

The SNBL provides scientists from both Norway and Switzerland, from both academia and industry, with increased access to synchrotron radiation. A user on SNBL has access to state-of-the-art, custom-designed instrumentation for diffraction and absorption experiments.



The European Spallation Source (ESS) will be a multi-disciplinary research laboratory based on the world’s most powerful neutron source. ESS can be likened to a large microscope, where neutrons are used instead of light to study materials – ranging from polymers and pharmaceuticals to membranes and molecules – to gain knowledge about their structure and function. ESS will be up to 100 times better than existing facilities, opening up new possibilities for researchers in for example health, environment, climate, energy, transport sciences and cultural heritage.

DECTRIS is the technology leader in X-Ray detection.

The DECTRIS photon counting detectors have transformed basic research at synchrotron light sources, as well as in the laboratory and with industrial X-Ray applications. DECTRIS aims to continuously improve the measurement quality, thereby enabling new scientific findings. This pioneering technology is the basis of a broad range of products, all scaled to meet the needs of various applications. DECTRIS also provides solutions for customer developments in scientific and industrial X-Ray detection.

Crystal Impact develops high quality software that allows even non-specialist users to apply most recent scientific and software technologies. Key areas of activity are crystal structure solution, visualization, and phase identification. Chemists and material scientists from industry and academic institutions in 59 countries all over the world use Crystal Impact's innovative software tools to determine, visualize and understand the crystal structures of their compounds.



The International Centre for Diffraction Data® (ICDD®) is a non-profit scientific organization dedicated to collecting, editing, publishing, and distributing powder diffraction data for the identification of materials. The membership of the ICDD consists of worldwide representation from academe, government, and industry.

NanoMEGAS is an SME created in Brussels in 2004 with the mission to develop electron diffraction solutions for material science applications by Transmission Electron Microscopy (TEM). NanoMEGAS was the first company to develop and commercialize Precession Electron Diffraction (PED) equipment that is compatible for almost all type of commercial TEM and has been installed in more than 120 laboratories all over the world. Based on PED method that consist a breakthrough in electron diffraction, various applications have been developed the last years. Electron crystallography has been considered as an alternative powerful tool for the structure analysis of crystals of few nm size and many important materials and compounds have been analyzed by TEM. In 2008 in collaboration (common Patent) with CNRS-INP Grenoble-France the Automated Phase-Orientation Mapping application, called “ASTAR”, has been launched which allows nm resolution maps (EBSD like) for any material in the TEM. ASTAR received the “Microscopy Today 2011 Innovation Award” during M&M 2011 Congress in USA. NanoMEGAS has also lately develop, in collaboration with NanoMEGAS USA (ex AppFive), a Strain Analysis method using TEM that provides results with high strain sensitivity (up to 0.02% of strain) and spatial resolution (up to 1nm or less when FEG-TEM is used). Due to the large number of NanoMEGAS devices and applications installed worldwide, the scientific production on Electron Diffraction applications has been exponentially increased since 2004 with more than 290 published papers.