-
09:30
EASY DATA ACQUISITION: High throughput routine characterisation available at the ESRF
-
Athanasios PAPAZOUGLOU
(ESRF)
-
10:00
Esay data analysis: Advanced Neutron Strain Characterization for Advanced Manufacturing at ILL
-
Sandra Cabeza
-
11:00
EASY DATA ANALYSIS - Artificial intelligence supporting data analysis
-
Joel EYMERY
(CEA INAC MEM NRS)
-
11:25
Introduction to Institut Néel
-
Eric MOSSANG
(Institut Néel)
-
11:30
EASY EXPLOITATION - Benchmark for development of in-line and at-line metrologies at CEA-LETI
-
Guillaume Freychet
(CEA LETI)
-
11:55
Introduction to SERMA
-
Pascal SALOME
