28-29 November 2019
Europe/Paris timezone

List of subjects - Micro and Nano-Electronics

List of subjects - Micro and Nano-Electronics

  • Advanced characterisation and test structures for failure analysis in electronic components and materials
    - New results in material characterisation and defect analysis;
      - Case studies on failure mechanisms and physics of failure;

  • Emerging reliability and variability assessment techniques for new materials, process development and novel devices;
  • In-situ and in-operando monitoring, non-destructive testing;
  • Advanced microscopy, strain measurement, surfaces and interface characterisation applied to semiconductor industry;
  • Statistical characterisation and material diagnostics for electronics;
  • New characterisation techniques for back-end interconnections, heterogeneous integration, advanced packaging, PCB;
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