SXNS17

Session

Instrumentation and methods I

15 Jul 2024, 16:20

ESRF Auditorium

Conveners

Instrumentation and methods I: Instrumentation and methods I

• Tom Arnold (ESS)

99. Reinventing lost art in reflectometry – as illustrated by polymer brushes

Dr Andrew Nelson (Australian Nuclear Science and Technology Organisation)

15/07/2024, 16:20

Invited

Many innovative data analysis approaches have been developed since the inception of the reflectometry technique. Unfortunately many of them have fallen out of active use due to the lack of software tools implementing those approaches, that are available to the surface science community. In this talk we'll revisit several of those approaches and their application for studying polymer brush...

78. ML-based online analysis and autonomous closed-loop experiments at synchrotron beamlines: A case study in x-ray reflectometry

Vladimir Starostin

15/07/2024, 16:50

Oral

Modern synchrotron beamlines and neutron instruments have undergone significant changes due to technological advances and newly deployed infrastructure. Thus, experiments are becoming more data-intensive and data-driven and increasingly relying on online data analysis for efficient use of experimental resources. In this regard machine-learning (ML) based approaches of specific importance for...

81. The ESTIA beamline at ESS - a new paradigm for neutron reflectometry

Joshaniel Cooper (European Spallation Source)

15/07/2024, 17:10

Oral

Neutron reflectometry is a powerful tool for investigating thin films and interfaces, with a host of industrially relevant applications from model cell membranes to next generation hard drive materials and everything in between. The information which can be extracted has all the usual benefits of using neutrons: isotope and light element sensitivity, as well as absolute magnetometry, but is...

68. Local atomic structure of highly ordered and highly disordered thin films: recent advances of in situ grazing incidence total x-ray scattering

Ann-Christin Dippel (Deutsches Elektronen-Synchrotron DESY), Mr Olof Gutowski (Deutsches Elektronen-Synchrotron DESY), Dr Martin v. Zimmermann (Deutsches Elektronen-Synchrotron DESY)

15/07/2024, 17:30

Oral

Complementary to x-ray diffraction patterns that represent the crystal lattice in reciprocal space, the atomic pair distribution function (PDF) describes the structure of a material as a histogram of interatomic distances r in real space. The total scattering approach that enables PDF analysis requires that scattering data is collected over a wide Q range of the order of 20 Å^-1...

9. Development of neutron reflectometry tomography and its application to polymer interfaces

Hiroyuki Aoki (Japan Atomic Energy Agency)

15/07/2024, 17:50

Oral

Neutron reflectometry (NR) is a powerful technique to explore the structure of the surface and interfaces of materials. In a typical NR experiment, the sample surface/interface must be uniform over an area of more than 10 cm² due to the size of the neutron illumination. Therefore, conventional NR has been inapplicable for the structure analysis of the sample with in-plane...