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16:30
Strain mapping of transistor structures in a 22nm Fully Depleted Silicon-On-Insulator technology
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Dominik Kleimaier
(Globalfoundries)
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16:30
Combined x-ray nano-tomography and Small Angle Neutron Scattering characterisation applied to reliability and process development
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rafael Varela Della Giustina
(Institut Laue-Langevin)
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16:30
Better in Vacuum - how vacuum can improve investigation of 2D materials using conductive Atomic Force Microscopy (AFM)
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Romain Bourrellier
(Park Systems)
Matthew Lefevre
(Park Systems)
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16:30
SINE2020: how a European project has provided access to neutron measurement techniques for various industrial sectors
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Caroline Boudou
(Institut Laue-Langevin)
-
16:30
Through thickness non-destructive residual stress-mapping on 6 mm thick Al-plates with neutron diffraction
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Caroline Boudou
(Institut Laue-Langevin)
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16:30
InnovaXN : a new PhD programme at ILL and ESRF
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Caroline Boudou
(Institut Laue-Langevin)
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16:30
Physics-based analytical modeling of AlGaN/GaN HEMT using gate field-plate technology for high-frequency applications
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MOURAD KADDECHE
(Université de Djilali Bounaâma- Khemis miliana, Ain Defla, 44225 Algeria)
