Nov 28 – 29, 2019
Europe/Paris timezone

Tutorial sessions

Bridging the gap between industry and advanced research, tutorial sessions on several characterisation techniques will be available during CARAC 2019. If you want to broaden your knowledge about advanced characterisation or if you want to deepen your understanding of the capabilities provided by such techniques, this opportunity is for you!

We have selected the best case studies among the panel of industrial applications of the CARAC 2019 partners which have already been supporting companies overcome their challenges for several years. During these tutorials and throughout CARAC 2019, you will have the unique opportunity to discuss face-to-face with our team of experts in laboratory, neutron and synchrotron x-ray characterisation.

Tutorial sessions

The tutorial sessions will take place on November 28th from 14h00 to 16h30. They will consist of 2 hours of clear and understandable presentations with a 15 minutes break. You can select which tutorial session you wish to attend in the event registration form. The tutorial sessions will be confirmed after 11 November based on the number of participants.

You can choose to attend one tutorial session focused in a specific track. Each session will include an overview of the advanced characterisation techniques available in that field, with industrial application cases and practical examples. The tutorials will provide you with guidelines and pragmatic tools to select the facilities and the techniques for your research needs, as well as give an idea of cost and delay.

Tutorials available:

  • Tutorial: Advanced Imaging
    This tutorial will present an overview of the different imaging techniques applicable to industrial R&D. A particular focus will be made on neutron and synchrotron X-ray imaging. After this session, you will be able to assess the capabilities of the different techniques and choose between them with autonomy. You will also have a better knowledge of their advantages and limitations as well as what results can be expected. The techniques will be illustrated with examples done at PAC-G facilities.

    List of techniques addressed Speaker

    Neutron tomography and radiography

    Dr. Alessandro Tengattini

    Synchrotron X-ray micro- and nano-computed tomography

    Dr. Elodie Boller

    Synchrotron X-ray diffraction imaging 

    Dr. José Baruchel

    Electron microscopy

    Dr. Nicolas Bernier

  • Tutorial: Interfaces and structure
    This tutorial will focus on specific problems of interfaces and physical characterisation of materials. It will show you how to characterise and/or measure structural properties (e.g. thickness, roughness, strain/stress, microstructure, lattice parameters etc.) of materials. A special attention will be given to the use of large-scale facilities such as the ESRF and ILL. The tutorial will be illustrated with examples done at the PAC-G facilities.

    Liste of techniques addressed Speaker

    Synchrotron X-ray reflectivity (XRR) and Neutron reflectivity (NR)

    Dr. Tra Nguyen (X-rays)
    Dr. Manon Letiche (neutrons)

    Non-destructive stress scanning using synchrotron X-rays and neutrons

    Dr. Thilo Pirling (neutrons)
    Dr. Thomas Buslaps (X-rays)

    X-ray diffraction (XRD)
    3D Reciprocal Space Mapping  (3D RSM)

    Dr. Hubert Renevier
    Dr. Tra Nguyen (3D RSM)

  • Tutorial: Chemical characterisation
    This tutorial is dedicated to techniques used to probe the chemical properties of the materials. You will be given an overview of some of the techniques available to determine the nature of phases present in a material, to determine the oxidation degrees of materials, to detect and quantify dopants/impurities/contaminants, and to quantify the elemental compositions of materials.
List of techniques addressed Speaker

X-ray Fluorescence (XRF, nano-XRF and TXRF)

Dr. Jaime Segura

X-ray Absorption Spectroscopie (EXAFS, XANES, ...)

Dr. Kirill Lomachenko

Energy Dispersive X-ray Analysis (EDX)

Dr. Eric Robin

X-ray photoelectron spectroscopy (XPS) and Secondary Ion Mass Spectroscopy (SIMS)

Dr. Olivier Renault